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    COOLΞD™ON LIGHT's proprietary closed-loop temperature monitoring driver (through the use of a temperature sensor/Integrated Circuit control). This exclusive driver powers a brushless MagLev® fan which features zero friction with no contact between shaft and bearing with rated acoustic noise of only 17 dBA (nearly inaudible, well below Energy Star's 20 dBA requirements). This exclusive technology enables ON LIGHT luminaires to yield higher luminous flux than most of its north american competitors while offering a rated life of 50 000 hours at L70.


    ΞZ Swap™: All COOLΞD™ enabled luminaires are offered with MIRO® ΞZ Swap™reflectors. ΞZ Swap™ reflectors do not require the use of any tools to swap and are easily interchangeable. Available beam spreads are: 16°, 27°, 31° and 58°


    Back2LifΞ : ON LIGHT's exclusive Luminaire Reconditionning System offered on all ON LIGHT products once they reach End Of Life (50 000 hours at L70). For example, for each COOLΞD  technology enabled luminaires, ON LIGHT will replace the LED chip, the brushless cooling fan and the LED driver while recycling all worn components and charge 50% of retail price. It's simple, clever and truly sustainable.

  • MIRO

    MIRO®: German aluminum reflector manufacturer Alanod trademark. Considered amongst the highest performance reflectors in the market because of their unequaled reflectance (up to 95% as per DIN 5036-3 and ASTM-E 1651 standards), they are manufactured out of 99.99% pure aluminum.

  • LM-79-08

    LM-79-08: "Approved Method: Electrical and Photometric Measurements of Solid-State Lighting Products" Lighting Measurements (aka LM) technical document published by the Illuminating Engineering Society (IES) in 2008. This "LM" lists the approved method for conducting LED luminaire electrical and photometric testing in a laboratory. This document provides guidelines for testing ambient temperature, testing equipment to be used and procedure to follow. Since LM-79 lab tests evaluate the performance of LED luminaires and lamps, the use of a recognized independent laboratory (such as NVLAP) is highly recommended.

  • LM-80-08

    LM-80-08: "Approved Method: Measuring Lumen Maintenance of LED Light Sources" Lighting Measurements (aka LM) technical document published by the Illuminating Engineering Society (IES) in 2008. This "LM" lists the approved method for conducting LED chip thermal and photometric testing in a laboratory.  This document provides testing guidelines including minimum test hours (6000 hours, 10 000 hours and beyond is recommended), reading frequency (every 1000 hours minimum), the number of samples to be tested (10x samples minimum, 20+ is recommended) as well as case temperature to which testing is to be conducted (55°C, 85°C and one selected by the LED chip manufacturer). The following parameters are to be tested for each three case temperature: lumen maintenance, chromacity shift (Duv) and color temperature shift in Kelvin. 

  • TM-21-11

    TM-21-11: "Projecting Long Term Lumen Maintenance of LED Light Sources" Technical Memorandum published by the Illuminating Engineering Society (IES) in 2011. This "TM" explains how to extrapolate and calculate LED fixture life in relation to In-Situ case temperature measurements using LM-80-08 data from the LED chip manufacturer. TM-21-11 also offers guidelines to determine "reported life" according to the number of LED chips tested and the number of hours of LM-80-08 testing done by the LED chip manufacturer. When the minimum LM-80-08 testing criterias are met (6 samples for 6000 hours and readings taken at 1000 hours intervals), the LED fixture manufacturer can use a 5.5 multiplier and thus publish a 33000 hours at L70 "reported life" (5.5 x 6000 hours). If the number of tested samples is 20 or more, the multiplier value is increase to 6. As an example, an LED fixture manufacturer using an LED chip that has been LM-80-08 tested for 20 samples and 9000 hours can publish a "reported life" of 60 000 hours at L70 (6 x 10000 hours).